News Researchers announce microwave-based chip imaging breakthrough

Discussion in 'Article Discussion' started by bit-tech, 4 Jul 2017.

  1. bit-tech

    bit-tech Supreme Overlord Staff Administrator

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  2. MLyons

    MLyons Half doge/ half dev Staff Administrator Super Moderator Moderator

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    o_O :rollingeyes: This sounds like one of those things that is really hyped up when discovered but sees no actual use.
     
  3. edzieba

    edzieba Virtual Realist

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    It's something extremely useful for people who design ICs, and not all that useful to anyone else. The current technique requires specific doping so cannot be used to reverse-engineer existing designs (or future designs that lack doping) so no sneaky-beakey applications yet. If you could develop a more sensitive microwave sensor so you could detect the changes in reflection of non-doped traces then that opens up sneakey-beakey applications but is not much use for normal IC development (going over a whole chip like this for validation would be exorbitantly expensive, so you may as well make a dedicated wafer with the dopant added if you're going to test something).
     
  4. Ramble

    Ramble Ginger Nut

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    Not so, semiconductor doping is extremely complicated, adding another tool to the arsenal (one that is relatively cheap too) could make a big difference to research in this area (which affects not only processors and things you're familiar with but also solar cells, chemistry, high performance amplifiers, etc.
     
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